Unusual growth of pulsed laser deposited bismuth films on Si(100)

Applied Surface Science

Volumn 138-139, Issue 1-4, 1999, Pages 188-194

  Dauscher, A ^a   Boffoue M O ^a   Lenoir, B ^a   Martin Lopez, R ^a   Scherrer, H ^a  

^a INSTITUT JEAN LAMOUR   (France)

Author keywords

Bismuth films; Growth conditions; Pulsed laser deposition; Transmission electron microscopy; X ray diffraction

Indexed keywords

EID: 0346552852     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0169-4332(98)00420-6     Document Type: Article

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