Surface-charge-induced reversible phase transitions of Bi nanoparticles

Small

Volumn 2, Issue 2, 2006, Pages 230-234

  Wagner, Jakob B ^a   Willinger, Marc Georg ^a   Müller, Jens Oliver ^a   Su, Dang Sheng ^a   Schlögl, Robert ^a  

^a FRITZ HABER INSTITUT DER MAX PLANCK GESELLSCHAFT   (Germany)

Author keywords

Electron microscopy; Nanoparticles; Phase transitions; Surface charge

Indexed keywords

CHARGE CARRIERS; ELECTRON MICROSCOPY; IMAGING TECHNIQUES; NANOSTRUCTURED MATERIALS; PHASE TRANSITIONS; SURFACE CHEMISTRY;

LATTICE FRINGES; NANOPARTICLES; SURFACE CHARGE;

BISMUTH;

BISMUTH; NANOMATERIAL;

ARTICLE; CHEMISTRY; CONFORMATION; CRYSTALLIZATION; ELECTRICITY; ELECTROCHEMISTRY; MATERIALS TESTING; METHODOLOGY; NANOTECHNOLOGY; PARTICLE SIZE; PHASE TRANSITION; SURFACE PROPERTY; ULTRASTRUCTURE;

BISMUTH; CRYSTALLIZATION; ELECTROCHEMISTRY; ELECTROSTATICS; MATERIALS TESTING; MOLECULAR CONFORMATION; NANOSTRUCTURES; NANOTECHNOLOGY; PARTICLE SIZE; PHASE TRANSITION; SURFACE PROPERTIES;

EID: 32144447135     PISSN: 16136810     EISSN: 16136829     Source Type: Journal    
DOI: 10.1002/smll.200500243     Document Type: Article

References (28)

1. X. Wang, H. Chen, Mater. Chem. Phys. 2002, 75, 2.
2. Z. Yue, J. Zhou, X. Wang, Z. Gui, L. Li, J. Eur. Ceram. Soc. 2003, 23, 189.
3. Z. Zhu, Y. Gao, X. Z. Che, Y. Q. Yang, C. Y. Chung, J. Alloys Compd. 2002, 330-332, 708.
4. D. B. Williams, C. B. Carter, Transmission Electron Microscopy, Plenum Press, New York, 1996.
5. R. F. Egerton, P. Li, M. Malac, Micron 2004, 35, 399.
6. F. Banhart, P. M. Ajayan, Nature 1996, 382, 433.
7. F. Banhart, J. Appl. Phys. 1997, 81, 3440.
8. Z. L. Wang, P. Poncharal, W. A. de Heer, J. Phys. Chem. Solids 2000, 61, 1025.
9. G. Fuchs, M. Treilleux, F. S. Aires, B. Cabaud, A. Hoareau, P. Melinon, Philos. Mag. A 1990, 61, 45.
10. P. Williams, Appl. Phys. Lett. 1987, 50, 1760.
11. Y. Lereah, R. Kofman, J. M. Pénisson, G. Deutscher, P. Cheyssac, T. B. David, A. Bourret, Philos. Mag. B 2001, 11, 1801.
12. P. A. Buffat, Philos. Trans. R. Soc. London, Ser. A 2003, 361, 291.
13. M. Tanaka, M. Takeguchi, K. Furuya, Micron 2002, 33, 441.
14. T. Ben-David, Y. Lereah, G. Deutscher, J. M. Penisson, A. Bourret, R. Kofman, P. Cheyssac, Phys. Rev. Lett. 1997, 78, 2585.
15. K. Lu, Z. H. Jin, Curr. Opin. Solid State Mater. Sci. 2001, 5, 39.
16. I. Ayub, D. S. Su, M. Willinger, A. Kharlamov, L. Ushkalov, V. A. Zazhigalov, N. Kirilova, R. Schlögl, Phys. Chem. Chem. Phys. 2003, 5, 970.
17. S. Bernal, F. J. Botana, J. J. Calvino, C. López-Cartes, J. A. Pérez-Omil, J. M. Rodríguez-Izquierdo, Ultramicroscopy 1998, 72, 135.
18. P. Stadelmann, Ultramicroscopy 1987, 21, 131.
19. M. Treilleux, G. Fuchs, C. Montandon, F. S. Aires, P. Melinon, B. Cabaud, A. Hoareau, Philos. Mag. A 1993, 67, 1071.
20. M. Treilleux, G. Fuchs, F. S. Aires, P. Melinon, A. Hoareau, B. Cabaud, Z. Phys. D 1991, 20, 263.
21. V. P. Skripov, V. P. Koverda, V. N. Skokov, Phys. Status Solidi A 1981, 66, 109.
22. L. H. Liang, J. C. Li, Q. Jiang, Physica B 2002, 322, 188.
23. V. B. Storozhev, Surf. Sci. 1998, 397, 170.
24. N. W. Ashcroft, N. D. Mermin, Solid State Physics, Saunders College Publishing, New York, 1976.
25. G. E. Smith, G. A. Baraff, J. M. Rowell, Phys. Rev. 1964, 235, A1118.
26. J. Cazaux, Ultramicroscopy 1995, 60, 411.
27. J. G. Che, C. T. Chan, Phys. Rev. B 2003, 67, 125411.
28. A. Y. Lozovoi, A. Alavi, Phys. Rev. B 2003, 68, 245416.