Astigmatic intensity equation for electron microscopy based phase retrieval

Ultramicroscopy

Volumn 107, Issue 8, 2007, Pages 635-643

  Petersen, Tim C ^a   Keast, Vicki J ^b  

^a UNIVERSITY OF SYDNEY   (Australia)

^b UNIVERSITY OF NEWCASTLE   (Australia)

Author keywords

Astigmatism; Phase retrieval; Transmission electron microscopy

Indexed keywords

ABERRATIONS; APPROXIMATION THEORY; FOURIER TRANSFORMS; IMAGE ANALYSIS; TRANSMISSION ELECTRON MICROSCOPY;

ASTIGMATISM; ELECTRON WAVES; PHASE RETRIEVAL; TRANSPORT OF INTENSITY EQUATION (TIE);

PHASE STRUCTURE;

ARTICLE; ELECTRON MICROSCOPY; THEORETICAL STUDY; VALIDATION PROCESS; WAVEFORM;

EID: 34247096947     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ultramic.2006.12.005     Document Type: Article

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