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Volumn 216, Issue 1-3, 2003, Pages 89-98

Computational aberration determination and correction

Author keywords

Aberration correction; Aberration determination; Microscopy; Phase retrieval; Zernike polynomials

Indexed keywords

ELECTRONS; IMAGING SYSTEMS; OPTICAL INSTRUMENT LENSES; OPTICAL RESOLVING POWER; POLYNOMIALS; RADIATION DAMAGE;

EID: 0037302739     PISSN: 00304018     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0030-4018(02)02298-8     Document Type: Article
Times cited : (14)

References (36)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.