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Volumn 216, Issue 1-3, 2003, Pages 89-98
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Computational aberration determination and correction
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Author keywords
Aberration correction; Aberration determination; Microscopy; Phase retrieval; Zernike polynomials
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Indexed keywords
ELECTRONS;
IMAGING SYSTEMS;
OPTICAL INSTRUMENT LENSES;
OPTICAL RESOLVING POWER;
POLYNOMIALS;
RADIATION DAMAGE;
HIGH-RESOLUTION TRANSMISSION ELECTRON MICROSCOPY (HRTEM);
ABERRATIONS;
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EID: 0037302739
PISSN: 00304018
EISSN: None
Source Type: Journal
DOI: 10.1016/S0030-4018(02)02298-8 Document Type: Article |
Times cited : (14)
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References (36)
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