Development of standards for surface analysis by ISO technical committee 201 on surface chemical analysis

Surface and Interface Analysis

Volumn 25, Issue 11, 1997, Pages 860-868

  Powell, C J ^a   Shimizu, R ^a  

^a NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AUGER ELECTRON SPECTROSCOPY; STANDARDIZATION; X RAY PHOTOELECTRON SPECTROSCOPY;

SURFACE CHEMICAL ANALYSIS;

SURFACE STRUCTURE;

EID: 0031249609     PISSN: 01422421     EISSN: None     Source Type: Journal    
DOI: 10.1002/(SICI)1096-9918(199710)25:11<860::AID-SIA309>3.0.CO;2-E     Document Type: Article

References (10)