Thermoreflectance calibration procedure on a laser diode: Application to catastrophic optical facet damage analysis

IEEE Electron Device Letters

Volumn 26, Issue 7, 2005, Pages 461-463

  Dilhaire, S ^a   Grauby, S ^a   Claeys, W ^a  

^a UNIVERSITÉ DE BORDEAUX   (France)

Author keywords

Reliability; Semiconductor lasers; Temperature measurement; Thermoreflectance

Indexed keywords

CALIBRATION; PELTIER EFFECT; RELIABILITY; TEMPERATURE MEASUREMENT;

CATASTROPHIC OPTICAL FACET DAMAGE; THERMOREFLECTANCE;

SEMICONDUCTOR LASERS;

EID: 22944435820     PISSN: 07413106     EISSN: None     Source Type: Journal    
DOI: 10.1109/LED.2005.851090     Document Type: Article

References (14)

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