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Volumn 258, Issue 1, 2007, Pages 178-182

Sputtering by highly charged ions: Application of the XY-TOF technique to secondary ion ejection from LiF

Author keywords

Highly charged ions; Lithium fluoride; Sputtering

Indexed keywords

ELECTRON ENERGY LEVELS; ION BOMBARDMENT; LITHIUM COMPOUNDS; SPUTTERING; VELOCITY MEASUREMENT;

EID: 34147136637     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nimb.2006.12.131     Document Type: Article
Times cited : (10)

References (22)
  • 8
    • 0001486737 scopus 로고
    • Seitz F., and Turnbull D. (Eds), Academic Press, New York
    • Seitz F., and Koehler J.S. In: Seitz F., and Turnbull D. (Eds). Solid State Physics Vol. 2 (1956), Academic Press, New York 307
    • (1956) Solid State Physics , vol.2 , pp. 307
    • Seitz, F.1    Koehler, J.S.2
  • 22
    • 34147105031 scopus 로고    scopus 로고
    • M. Toulemonde, W. Assmann, C. Trautmann, private communication, 2006.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.