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Volumn 201, Issue 16-17, 2007, Pages 7235-7240

Substrate tilting effect on structure of tetrahedral amorphous carbon films by Raman spectroscopy

Author keywords

Hardness; Internal stress; Raman spectra; Substrate tilting angle; Tetrahedral amorphous carbon films

Indexed keywords

AMORPHOUS FILMS; HARDNESS; MAGNETIC RECORDING; RAMAN SPECTROSCOPY; RESIDUAL STRESSES;

EID: 34047266219     PISSN: 02578972     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.surfcoat.2007.01.030     Document Type: Article
Times cited : (20)

References (22)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.