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Volumn 201, Issue 16-17, 2007, Pages 7235-7240
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Substrate tilting effect on structure of tetrahedral amorphous carbon films by Raman spectroscopy
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Author keywords
Hardness; Internal stress; Raman spectra; Substrate tilting angle; Tetrahedral amorphous carbon films
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Indexed keywords
AMORPHOUS FILMS;
HARDNESS;
MAGNETIC RECORDING;
RAMAN SPECTROSCOPY;
RESIDUAL STRESSES;
FILM FORMATION;
SUBSTRATE TILTING;
TETRAHEDRAL AMORPHOUS CARBON FILMS;
TILTING ANGLE;
AMORPHOUS CARBON;
AMORPHOUS CARBON;
AMORPHOUS FILMS;
HARDNESS;
MAGNETIC RECORDING;
RAMAN SPECTROSCOPY;
RESIDUAL STRESSES;
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EID: 34047266219
PISSN: 02578972
EISSN: None
Source Type: Journal
DOI: 10.1016/j.surfcoat.2007.01.030 Document Type: Article |
Times cited : (20)
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References (22)
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