Extraction of the gate capacitance coupling coefficient in floating gate non-volatile memories: Statistical study of the effect of mismatching between floating gate memory and reference transistor in dummy cell extraction methods

Solid-State Electronics

Volumn 51, Issue 4 SPEC. ISS., 2007, Pages 585-592

  Rafhay, Quentin ^a   Beug, M Florian ^a   Duane, Russell ^a  

^a UNIVERSITY COLLEGE CORK   (Ireland)

Author keywords

Dummy cell extraction method; Floating gate flash non volatile memory; Gate capacitance coupling coefficient; Mismatching; Reference transistor

Indexed keywords

CAPACITANCE; COMPUTATIONAL GEOMETRY; MEASUREMENT THEORY; TRANSISTORS;

DUMMY CELL EXTRACTION METHOD; GATE CAPACITANCE COUPLING COEFFICIENT; REFERENCE TRANSISTOR;

DATA STORAGE EQUIPMENT;

EID: 34047262490     PISSN: 00381101     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.sse.2007.02.012     Document Type: Article

References (13)

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