A novel method for the experimental determination of the coupling ratios in submicron EPROM and Flash EEPROM cells

Technical Digest - International Electron Devices Meeting

Volumn , Issue , 1990, Pages 99-102

  Bez, R ^a   Camerlenghi, E ^a   Cantarelli, D ^a   Ravazzi, L ^a   Crisenza, G ^a  

^a STMICROELECTRONICS   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

DATA STORAGE, SEMICONDUCTOR; TRANSISTORS, FIELD EFFECT;

EEPROM; EPROM; HOT ELECTRONS; MOS TRANSISTORS;

DATA STORAGE, DIGITAL;

EID: 0025575980     PISSN: 01631918     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (7)