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Volumn 18, Issue 14, 2006, Pages 1536-1538

Low turn-on voltage and series resistance of polarization-induced InGaN-GaN LEDs by using p-InGaN/p-GaN superlattice

Author keywords

Index terms ingan gan superlattice; Light emitting diode (led); Oxidized ni au scheme; Polarization induced effect

Indexed keywords

ELECTRICAL MEASUREMENT; ELECTRICAL PROPERTY; GAN LEDS; HIGH STRESS; INDEX TERMS; INDEX TERMS-INGAN-GAN SUPERLATTICE; MULTIPLE QUANTUM WELLS; OUTPUT POWER; P-INGAN; PHOTON WAVELENGTH; POLARIZATION-INDUCED EFFECTS; SERIES RESISTANCES; TURN ON VOLTAGE;

EID: 34047185686     PISSN: 10411135     EISSN: None     Source Type: Journal    
DOI: 10.1109/LPT.2006.877621     Document Type: Article
Times cited : (19)

References (11)
  • 1
    • 0029346154 scopus 로고
    • High-brightness InGaN blue, green and yellow light-emitting diodes with quantum well structures
    • Jul.
    • S. Nakamura, S. Senoh, N. Iwasa, and S. Nagahama, "High-brightness InGaN blue, green and yellow light-emitting diodes with quantum well structures," Jpn. J. Appl. Phys., vol. 34, pp. L797-L799, Jul. 1995.
    • (1995) Jpn. J. Appl. Phys. , vol.34
    • Nakamura, S.1    Senoh, S.2    Iwasa, N.3    Nagahama, S.4
  • 2
    • 18744380133 scopus 로고    scopus 로고
    • Electrical characterization of acceptor levels in Mg-doped GaN
    • Nov.
    • Y. Nakano and T. Jimbo, "Electrical characterization of acceptor levels in Mg-doped GaN," J. Appl. Phys., vol. 92, pp. 5590-5592, Nov. 2002.
    • (2002) J. Appl. Phys. , vol.92 , pp. 5590-5592
    • Nakano, Y.1    Jimbo, T.2
  • 3
    • 0035927104 scopus 로고    scopus 로고
    • Current crowding and optical saturation effects in GaInN/GaN light emitting diodes grown on insulating substrates
    • May
    • X. Guo and E. F. Schubert, "Current crowding and optical saturation effects in GaInN/GaN light emitting diodes grown on insulating substrates," Appl. Phys. Lett., vol. 78, pp. 3337-3339, May 2001.
    • (2001) Appl. Phys. Lett. , vol.78 , pp. 3337-3339
    • Guo, X.1    Schubert, E.F.2
  • 8
    • 0020089025 scopus 로고
    • The effects of contact size and nonzero metal resistance on the determination of special contact resistance
    • Feb.
    • G. S. Marlow and M. B. Das, "The effects of contact size and nonzero metal resistance on the determination of special contact resistance," Solid State Electron., vol. 25, pp. 91-94, Feb. 1982.
    • (1982) Solid State Electron. , vol.25 , pp. 91-94
    • Marlow, G.S.1    Das, M.B.2
  • 9
    • 0042099114 scopus 로고    scopus 로고
    • Cambridge, U.K.: Cambridge Univ. Press
    • E. F. Schubert, Light-Emitting Diodes. Cambridge, U.K.: Cambridge Univ. Press, 2003, pp. 60-61.
    • (2003) Light-Emitting Diodes. , pp. 60-61
    • Schubert, E.F.1
  • 10
    • 7044233214 scopus 로고    scopus 로고
    • Junction-temperature measurement in GaN ultraviolet light-emitting diodes using diode forward voltage method
    • Sep.
    • Y. Xi and E. F. Schubert, "Junction-temperature measurement in GaN ultraviolet light-emitting diodes using diode forward voltage method," Appl. Phys. Lett., vol. 85, pp. 2163-2165, Sep. 2004.
    • (2004) Appl. Phys. Lett. , vol.85 , pp. 2163-2165
    • Xi, Y.1    Schubert, E.F.2
  • 11
    • 19044378210 scopus 로고    scopus 로고
    • An electrical model with junction temperature for light-emitting diodes and the impact on conversion efficiency
    • May
    • J. Park and C. C. Lee, "An electrical model with junction temperature for light-emitting diodes and the impact on conversion efficiency," IEEE Electron. Device Lett., vol. 26, no. 5, pp. 308-310, May 2005.
    • (2005) IEEE Electron. Device Lett. , vol.26 , Issue.5 , pp. 308-310
    • Park, J.1    Lee, C.C.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.