Influence of structural imperfection of Σ5 grain boundaries in bulk multicrystalline Si on their electrical activities

Journal of Applied Physics

Volumn 101, Issue 6, 2007, Pages

  Kutsukake, Kentaro ^a   Usami, Noritaka ^a   Fujiwara, Kozo ^a   Nose, Yoshitaro ^a   Nakajima, Kazuo ^a  

^a TOHOKU UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL GROWTH FROM MELT; CRYSTAL ORIENTATION; CRYSTALLINE MATERIALS; ELECTRON BEAMS; EPITAXIAL GROWTH; SILICON COMPOUNDS;

ARTIFICIALLY CONTROLLED CONFIGURATION; BULK MULTICRYSTALLINE SILCON; ELECTRICAL ACTIVITY; SEED CRYSTALS;

GRAIN BOUNDARIES;

EID: 34047141600     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2710348     Document Type: Article

References (17)

1. M. Imaizumi, T. Ito, M. Yamaguchi, and K. Kaneko, J. Appl. Phys. 81, 7635 (1997).
2. V. Randle, Acta Mater. 46, 1459 (1998).
3. R. Shimokawa and Y. Hayashi, J. Appl. Phys. 59, 2571 (1986).
4. A. Bary and G. Nouet, J. Appl. Phys. 63, 435 (1988).
5. Z. J. Wang, S. Tsurekawa, K. Ikeda, T. Sekiguchi, and T. Watanabe, Interface Sci. 7, 197 (1999).
6. M. Kohyama, R. Yamamoto, and M. Doyama, Phys. Status Solidi B 138, 387 (1986).
7. M. Kohyama and R. Yamamoto, Phys. Rev. B 50, 8502 (1994).
8. J. Chen, T. Sekiguchi, D. Yang, F. Yin, K. Kido, and S. Tsurekawa, J. Appl. Phys. 96, 5490 (2004).
9. J. Chen, D. Yang, Z. Xi, and T. Sekiguchi, J. Appl. Phys. 97, 033701 (2005).
10. M. Kohyama, R. Yamamoto, Y. Ebata, M. Kinoshita, J. Phys. C 21, 3205 (1988).
11. G. Martinelli and R. Kibizov, Appl. Phys. Lett. 62, 3262 (1993).
12. N. Usami, M. Kitamura, T. Sugawara, K. Kutsukake, K. Ohdaira, Y. Nose, K. Fujiwara, T. Shishido, and K. Nakajima, Jpn. J. Appl. Phys., Part 2 44, L778 (2005).
13. K. Ikeda, T. Sekiguchi, S. Ito, M. Takeda, and M. Suezawa, J. Cryst. Growth 210, 90 (2000).
14. R. Rizk, X. Portier, G. Allais, and G. Nouet, J. Appl. Phys. 76, 952 (1994).
15. C. Donolato, J. Appl. Phys. 54, 1314 (1983).
16. R. Corkish, T. Puzzer, A. B. Sproul, and K. L. Luke, J. Appl. Phys. 84, 5473 (1998).
17. T. E. Everhart and P. H. Hoff, J. Appl. Phys. 42, 5837 (1971).