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Volumn 210, Issue 1-2 SPEC., 2003, Pages 22-26

Jumping mode scanning force microscopy: A suitable technique for imaging DNA in liquids

Author keywords

Atomic force microscopy; DNA; Jumping mode; Scanning force microscopy

Indexed keywords

ADSORPTION; ATOMIC FORCE MICROSCOPY; MEDICAL IMAGING; NUCLEAR MAGNETIC RESONANCE SPECTROSCOPY; SURFACE TOPOGRAPHY; X RAY CRYSTALLOGRAPHY;

EID: 0037474578     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0169-4332(02)01473-3     Document Type: Conference Paper
Times cited : (14)

References (32)
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    • F. Moreno-Herrero, J. Colchero, A.M. Baro, Ultramicroscopy, submitted for publication.
    • F. Moreno-Herrero, J. Colchero, A.M. Baro, Ultramicroscopy, submitted for publication.
  • 24
    • 37049048544 scopus 로고
    • Kidd M. Nature. 197:1963;192-193.
    • (1963) Nature , vol.197 , pp. 192-193
    • Kidd, M.1
  • 27
    • 0012348125 scopus 로고    scopus 로고
    • http://www.nanotec.es.
  • 28
    • 0012295833 scopus 로고    scopus 로고
    • Olympus Optical Co. (Europa) GMBH, Wenderstrasse 14-18, 20097 Hamburg
    • Olympus Optical Co. (Europa) GMBH, Wenderstrasse 14-18, 20097 Hamburg.
  • 30
    • 0012348715 scopus 로고    scopus 로고
    • Nanosensors GmbH & Co, KG IMO-Building, Im Amtmann 6, D-35578 Wetzlar-Blankenfeld Germany
    • Nanosensors GmbH & Co, KG IMO-Building, Im Amtmann 6, D-35578 Wetzlar-Blankenfeld Germany.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.