A novel power gating scheme with charge recycling

IEICE Electronics Express

Volumn 3, Issue 12, 2006, Pages 281-286

  Tada, Akira ^a   Notani, Hiromi ^a   Numa, Masahiro ^b  

^a RENESAS TECHNOLOGY CORP   (Japan)

^b KOBE UNIVERSITY   (Japan)

Author keywords

Charge recycling; Leak current; Low power; MTCMOS; Power gating; State retention

Indexed keywords

EID: 33947424354     PISSN: None     EISSN: 13492543     Source Type: Journal    
DOI: 10.1587/elex.3.281     Document Type: Article

References (6)

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