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Volumn 301-302, Issue SPEC. ISS., 2007, Pages 513-516
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RF-MBE growth of InN/InGaN quantum well structures on 3C-SiC substrates
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Author keywords
A1. X ray diffraction; A3. Molecular beam epitaxy; A3. Quantum wells; B1. Nitrides; B2. Semiconducting III V materials
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Indexed keywords
CRYSTAL GROWTH;
NITRIDES;
OPTICAL PROPERTIES;
SEMICONDUCTOR QUANTUM WELLS;
SURFACE MORPHOLOGY;
X RAY DIFFRACTION;
PL EMISSIONS;
RADIO FREQUENCY PLASMA ASSISTED MOLECULAR BEAM EPITAXY (RF-MBE);
SEMICONDUCTING III-V MATERIALS;
XRD SATELLITE PEAKS;
MOLECULAR BEAM EPITAXY;
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EID: 33947366440
PISSN: 00220248
EISSN: None
Source Type: Journal
DOI: 10.1016/j.jcrysgro.2006.11.117 Document Type: Article |
Times cited : (9)
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References (12)
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