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Volumn 879, Issue , 2007, Pages 1597-1602

High resolution hard X-ray photoemission spectroscopy at SPring-8: Basic performance and characterization

Author keywords

Electronic structure; Hard X ray; Photoemission spectroscopy

Indexed keywords


EID: 33947357647     PISSN: 0094243X     EISSN: 15517616     Source Type: Conference Proceeding    
DOI: 10.1063/1.2436371     Document Type: Conference Paper
Times cited : (3)

References (21)
  • 2
    • 33947402923 scopus 로고    scopus 로고
    • The electron inelastic-mean-free-paths were estimated using NIST Standard Reference Database 71, NIST Electron Inelastic-Mean-Free-Path Database: Ver. 1.1. It is distributed via the Web site http://www.nist.gov/srd/ nist71.htm, and references therein.
    • The electron inelastic-mean-free-paths were estimated using NIST Standard Reference Database 71, "NIST Electron Inelastic-Mean-Free-Path Database: Ver. 1.1". It is distributed via the Web site http://www.nist.gov/srd/ nist71.htm, and references therein.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.