Evidence for suppressed screening on the surface of high temperature La2-xSrxCuO4 and Nd2-xCexCuO4 superconductors

Physical Review Letters

Volumn 95, Issue 17, 2005, Pages

  Taguchi, M ^a   Chainani, A ^a   Horiba, K ^a   Takata, Y ^a   Yabashi, M ^a,b   Tamasaku, K ^a   Nishino, Y ^a   Miwa, D ^a   Ishikawa, T ^a   Takeuchi, T ^a   Yamamoto, K ^a   Matsunami, M ^a   Shin, S ^a,c   Yokoya, T ^b   Ikenaga, E ^b   Kobayashi, K ^b   Mochiku, T ^d   Hirata, K ^d   Hori, J ^e   Ishii, K ^e   Nakamura, F ^e   Suzuki, T ^e   more..

^a SPring 8 ^*  (Japan)

^b JAPAN SYNCHROTRON RADIATION RESEARCH INSTITUTE   (Japan)

^c UNIVERSITY OF TOKYO   (Japan)

^d NATIONAL INSTITUTE FOR MATERIALS SCIENCE   (Japan)

^e HIROSHIMA UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

CHEMICAL-POTENTIAL SHIFT; IMPURITY ANDERSON MODEL CALCULATIONS; SUPPRESSED SCREENING; ZHANG-RICE;

ABSORPTION SPECTROSCOPY; LANTHANUM COMPOUNDS; SCREENING; SEMICONDUCTOR DOPING; SUPERCONDUCTING MATERIALS; X RAY PHOTOELECTRON SPECTROSCOPY;

SURFACE PHENOMENA;

EID: 28844454697     PISSN: 00319007     EISSN: 10797114     Source Type: Journal    
DOI: 10.1103/PhysRevLett.95.177002     Document Type: Article

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