Polarizance of a synthetic mica crystal polarizer and the degree of linear polarization of an undulator beamline at 880 eV evaluated by the rotating-analyzer method

Review of Scientific Instruments

Volumn 76, Issue 12, 2005, Pages 1-4

  Imazono, Takashi ^a   Hirono, Toko ^b   Kimura, Hiroaki ^b   Saitoh, Yuji ^a   Ishino, Masahiko ^a   Muramatsu, Yasuji ^a,d   Koike, Masato ^a   Sano, Kazuo ^c  

^a JAPAN ATOMIC ENERGY AGENCY   (Japan)

^b JAPAN SYNCHROTRON RADIATION RESEARCH INSTITUTE   (Japan)

^c Shimadzu Emit Co Ltd   (Japan)

^d UNIVERSITY OF HYOGO   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

GEOMETRY; MICA; PHOTONS; SINGLE CRYSTALS;

BRAGG GEOMETRY; INCIDENT LIGHT; PHOTON ENERGY; ROTATING-ANALYZER METHOD; SYNTHETIC MICA CRYSTAL POLARIZER;

POLARIZATION;

EID: 29744457274     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2140492     Document Type: Article

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