RF-MBE growth and structural characterization of cubic InN films on yttria-stabilized zirconia (0 0 1) substrates

Journal of Crystal Growth

Volumn 301-302, Issue SPEC. ISS., 2007, Pages 508-512

  Nakamura, T ^a   Tokumoto, Y ^a   Katayama, R ^a   Yamamoto, T ^a   Onabe, K ^a  

^a UNIVERSITY OF TOKYO   (Japan)

Author keywords

A1. Crystal structure; A1. High resolution X ray diffraction; A3. Molecular beam epitaxy; B1. InN

Indexed keywords

CHARACTERIZATION; CRYSTAL STRUCTURE; INDIUM COMPOUNDS; MOLECULAR BEAM EPITAXY; X RAY DIFFRACTION; YTTRIA STABILIZED ZIRCONIA;

CRYSTAL QUALITY; HIGH RESOLUTION X RAY DIFFRACTION; RF PLASMA ASSISTED MOLECULAR BEAM EPITAXY; STRUCTURAL CHARACTERIZATION;

THIN FILMS;

EID: 33947323292     PISSN: 00220248     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jcrysgro.2006.11.046     Document Type: Article

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