RF-MBE growth and structural characterization of cubic InN films on GaAs

Physica Status Solidi (B) Basic Research

Volumn 243, Issue 7, 2006, Pages 1451-1455

  Nakamura, T ^a   Iida, K ^a   Katayama, R ^a   Yamamoto, T ^a   Onabe, K ^a  

^a UNIVERSITY OF TOKYO   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 33745763724     PISSN: 03701972     EISSN: 15213951     Source Type: Journal    
DOI: 10.1002/pssb.200565376     Document Type: Conference Paper

References (4)

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2. V. Cimalla, J. Pezoldt, G. Ecke, R. Koshiba, O. Ambacher, L. Spieß, G. Teichert, H. Lu, and W. J. Schaff, Appl. Phys. Lett. 83, 27 (2003).
3. K. Nishida, Y. Kitamura, Y. Hijikata, H. Yaguchi, and S. Yoshida, phys. stat. sol. (b) 241, 2839 (2004).
4. S. Sanorpim, E. Takuma, R. Katayama, K. Onabe, H. Ichinose, and Y. Shiraki, phys. stat. sol. (b) 234, 840 (2002).