Field-emission breakdown and electromigration in insulated planar nanoscopic contacts

IEEE Transactions on Electron Devices

Volumn 53, Issue 12, 2006, Pages 2958-2963

  Bramanti, Alessandro ^a   Maruccio, Giuseppe ^b   Visconti, Paolo ^b,c   D'Amico, Stefano ^b,c   Cingolani, Roberto ^b   Rinaldi, Ross ^b  

^a STMICROELECTRONICS   (Italy)

^b NATIONAL NANOTECHNOLOGY LABORATORY   (Italy)

^c UNIVERSITY OF SALENTO   (Italy)

Author keywords

Contacts; Electric breakdown; Electromigration; Electron emission

Indexed keywords

CURRENT VOLTAGE CHARACTERISTICS; ELECTRIC CONTACTS; ELECTROMIGRATION; FIELD EMISSION;

EMITTING SURFACES; FIELD EMISSION BREAKDOWN; FIELD EMITTERS; PLANAR NANOSCOPIC CONTACTS;

ELECTRIC BREAKDOWN;

EID: 33947269300     PISSN: 00189383     EISSN: None     Source Type: Journal    
DOI: 10.1109/TED.2006.885659     Document Type: Article

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