Analytical Approach to Breakdown under Impulse Conditions

IEEE Transactions on Dielectrics and Electrical Insulation

Volumn 11, Issue 1, 2004, Pages 90-97

  Boggs, Steven ^a,b  

^a UNIVERSITY OF CONNECTICUT   (United States)

^b UNIVERSITY OF TORONTO   (Canada)

Author keywords

Breakdown; Cable; Field computation; Impulse; XLPE

Indexed keywords

BREAKDOWN; CABLE; FIELD COMPUTATION; IMPULSE; XLPE;

CAPACITANCE; CROSSLINKING; DIFFUSION; ELECTRIC FIELD EFFECTS; ELECTRIC POTENTIAL; ELECTRODES; ELECTROSTATICS; MOLECULAR STRUCTURE; PLASMAS; POLYETHYLENES;

ELECTRIC BREAKDOWN;

EID: 1842477149     PISSN: 10709878     EISSN: None     Source Type: Journal    
DOI: 10.1109/TDEI.2004.1266321     Document Type: Article

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