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ChemPhysChem

Volumn 8, Issue 4, 2007, Pages 586-591

Field-force alignment of disc-type π systems

(4) Cristadoro, Anna a Lieser, Günter a Räder, Hans Joachim a Müllen, Klaus a

a MAX PLANCK INSTITUTE FOR POLYMER RESEARCH (Germany)

Author keywords

Electron diffraction; Electron microscopy; Semiconductors; Thin layers; X ray diffraction

Indexed keywords

ATOMIC FORCE MICROSCOPY; ELECTRIC FIELDS; ELECTRON DIFFRACTION; ELECTRON MICROSCOPY; ELECTRONS; HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY; SCANNING ELECTRON MICROSCOPY; SEMICONDUCTOR MATERIALS; X RAY DIFFRACTION;

CROSS-POLARIZED; DISC-LIKE MOLECULES; HEXABENZOCORONENE; HIGH ANISOTROPY; HIGHLY ORDERED STRUCTURE; SEMICONDUCTING MOLECULES; SOLVENT EVAPORATION; THIN LAYERS;

MOLECULES;

EID: 33947232689 PISSN: 14394235 EISSN: 14397641 Source Type: Journal
DOI: 10.1002/cphc.200600612 Document Type: Article

Times cited : (34)

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