Two-dimensional mapping of triaxial strain fields in a multiferroic BiFeO3 thin film using scanning x-ray microdiffraction

Applied Physics Letters

Volumn 90, Issue 10, 2007, Pages

  Bark, Chung W ^c   Cho, Kyung C ^c   Koo, Yang M ^c   Tamura, Nobumichi ^a   Ryu, Sangwoo ^c   Jang, Hyun M ^b  

^a LAWRENCE BERKELEY NATIONAL LABORATORY   (United States)

^b Pohang University of Science and Technology (POSTECH)   (South Korea)

^c NONE

Author keywords

[No Author keywords available]

Indexed keywords

BISMUTH COMPOUNDS; CORRELATION METHODS; CRYSTAL ORIENTATION; GRAIN BOUNDARIES; POLARIZATION; SATURATION MAGNETIZATION; STRAIN;

GRAIN-ORIENTATION; IN-PLANE STRAIN; MULTIFERROIC BFO FILM; SYNCHROTRON X-RAY MICRODIFFRACTION;

THIN FILMS;

EID: 33947095131     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2711530     Document Type: Article

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