Electric-field-induced structural modulation of epitaxial BiFeO3 multiferroic thin films as studied using x-ray microdiffraction

Applied Physics Letters

Volumn 90, Issue 2, 2007, Pages

  Bark, Chung W ^b   Ryu, Sangwoo ^b   Koo, Yang M ^b   Jang, Hyun M ^a   Youn, Hwa S ^a  

^a Pohang University of Science and Technology (POSTECH)   (South Korea)

^b NONE

Author keywords

[No Author keywords available]

Indexed keywords

BISMUTH COMPOUNDS; ELECTRIC FIELDS; EPITAXIAL GROWTH; FREE ENERGY; RAY TRACING; X RAY DIFFRACTION;

APPLIED ELECTRIC FIELD; PSEUDOTETRAGONAL THIN FILM; STRUCTURAL MODULATION; SYNCHROTRON X-RAY MICRODIFFRACTION;

THIN FILMS;

EID: 33846249223     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2430678     Document Type: Article

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