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Technical Digest - International Electron Devices Meeting, IEDM
Volumn 2005, Issue , 2005, Pages 667-670
Ultra-fast programming of silicided polysilicon fuses based on new insights in the programming physics
Author keywords

[No Author keywords available]
Indexed keywords

CMOS INTEGRATED CIRCUITS; ELECTRIC RESISTANCE; SILICIDES; TRANSMISSION ELECTRON MICROSCOPY;
EID: 33847731452     PISSN: 01631918     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (15)
References (6)
  • 1
    • 33847740181 scopus 로고    scopus 로고
    • Reliability and design qualification of a sub-micron tungsten suicide E-Fuse
    • W.R. Tonti et al., "Reliability and design qualification of a sub-micron tungsten suicide E-Fuse", IRPS Proceedings, p. 152-156, 2004
    • (2004) IRPS Proceedings , pp. 152-156
    • Tonti, W.R.1
  • 2
    • 28744447130 scopus 로고    scopus 로고
    • Melt-segregate-quench programming of electrical fuse
    • T. Sasaki, N. Otsuka, K. Hisano, S. Fujii, "Melt-segregate-quench programming of electrical fuse", IRPS Proceedings, p.347-351, 2005
    • (2005) IRPS Proceedings , pp. 347-351
    • Sasaki, T.1    Otsuka, N.2    Hisano, K.3    Fujii, S.4
  • 3
    • 28744456317 scopus 로고    scopus 로고
    • Lifetime study for a poly fuse in a 0.35μm polycide CMOS process
    • J. Fellner, P. Boesmueller, Heinz Reiter, "Lifetime study for a poly fuse in a 0.35μm polycide CMOS process", IRPS Proceedings, p.446-449, 2005
    • (2005) IRPS Proceedings , pp. 446-449
    • Fellner, J.1    Boesmueller, P.2    Reiter, H.3
  • 4
    • 84886448067 scopus 로고    scopus 로고
    • A PROM Element Based on Salicide Agglomeration of Poly Fuses in a CMOS Logic Process
    • M. Alavi et al., "A PROM Element Based on Salicide Agglomeration of Poly Fuses in a CMOS Logic Process", IEDM Technical Digest, p.855-858, 1997
    • (1997) IEDM Technical Digest , pp. 855-858
    • Alavi, M.1
  • 6
    • 0036714040 scopus 로고    scopus 로고
    • Electrically Programmable Fuse (eFUSE) Using Electromigration in Suicides
    • C. Kothandaraman, S.K. Iyer, S.S. Iyer, "Electrically Programmable Fuse (eFUSE) Using Electromigration in Suicides", IEEE Electron Device Letters, vol. 23, no. 9, p. 523-525, 2002
    • (2002) IEEE Electron Device Letters , vol.23 , Issue.9 , pp. 523-525
    • Kothandaraman, C.1    Iyer, S.K.2    Iyer, S.S.3

* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.