Image processing for resonance frequency mapping in atomic force modulation microscopy

Review of Scientific Instruments

Volumn 78, Issue 2, 2007, Pages

  Arinro R ^a   Lvque G ^a   Girard, P ^a   Ferrandis, J Y ^a  

^a UNIVERSITÉ MONTPELLIER II   (France)

Author keywords

[No Author keywords available]

Indexed keywords

APPROXIMATION THEORY; ATOMIC FORCE MICROSCOPY; MECHANICAL PROPERTIES; NATURAL FREQUENCIES; POLYSTYRENES; SPECTRUM ANALYSIS;

ATOMIC FORCE MODULATION MICROSCOPY; CANTILEVERS; LORENTZIAN CURVE; RESONANCE SPECTRUM;

IMAGE PROCESSING;

EID: 33847643200     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2432264     Document Type: Article

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