Analysis of Depth Profiling Data Obtained by Confocal Raman Microspectroscopy

Applied Spectroscopy

Volumn 57, Issue 9, 2003, Pages 1123-1128

  Vyorykka J ^a   Paaso, J ^b   Tenhunen, M ^b   Tenhunen, J ^b   Iitti, H ^a   Vuorinen, T ^a   Stenius, P ^a  

^a AALTO UNIVERSITY   (Finland)

^b VTT TECHNICAL RESEARCH CENTRE OF FINLAND   (Finland)

Author keywords

Confocal Raman; Deconvolntion; Depth profiling; Point spread fonction

Indexed keywords

LIGHT REFRACTION; OPTICAL RESOLVING POWER; REFRACTIVE INDEX; STRUCTURE (COMPOSITION);

DEPTH PROFILING;

RAMAN SPECTROSCOPY;

POLYETHYLENE TEREPHTHALATE;

ALGORITHM; ARTICLE; CHEMICAL STRUCTURE; CHEMISTRY; COMPARATIVE STUDY; COMPUTER SIMULATION; CONFOCAL MICROSCOPY; EVALUATION; INSTRUMENTATION; METHODOLOGY; MICROSPECTROPHOTOMETRY; QUALITY CONTROL; RADIATION SCATTERING; RAMAN SPECTROMETRY; REPRODUCIBILITY; SENSITIVITY AND SPECIFICITY; VALIDATION STUDY;

ALGORITHMS; COMPUTER SIMULATION; MICROSCOPY, CONFOCAL; MICROSPECTROPHOTOMETRY; MODELS, MOLECULAR; POLYETHYLENE TEREPHTHALATES; QUALITY CONTROL; REPRODUCIBILITY OF RESULTS; SCATTERING, RADIATION; SENSITIVITY AND SPECIFICITY; SPECTRUM ANALYSIS, RAMAN;

EID: 2342526863     PISSN: 00037028     EISSN: None     Source Type: Journal    
DOI: 10.1366/00037020360695982     Document Type: Article

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