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Volumn 2, Issue , 2005, Pages 768-773

Effects of re-finishing of terminations by solder-dipping on plastic quad flatpack electronic parts

Author keywords

[No Author keywords available]

Indexed keywords

RISK MITIGATION; SOLDER-DIPPING; THERMAL SHOCKS; TIN WHISKERING;

EID: 33847299577     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (5)

References (12)
  • 1
    • 84889476995 scopus 로고    scopus 로고
    • 2004 Edition, CALCE EPSC Press, University of Maryland, College Park, MD
    • Ganesan, S. and Pecht, M., "Lead-free Electronics", 2004 Edition, CALCE EPSC Press, University of Maryland, College Park, MD.
    • Lead-free Electronics
    • Ganesan, S.1    Pecht, M.2
  • 3
    • 33847266356 scopus 로고    scopus 로고
    • NEMI Recommends Standard Test Methods to Assess Propensity for Tin Whisker Growth
    • November
    • Vo, N., Bogoslavsky, I. and Bush, P. "NEMI Recommends Standard Test Methods to Assess Propensity for Tin Whisker Growth", Surface Mount Technology, Vol. 17, No. 11, November 2003, pp. 36-41.
    • (2003) Surface Mount Technology , vol.17 , Issue.11 , pp. 36-41
    • Vo, N.1    Bogoslavsky, I.2    Bush, P.3
  • 4
    • 33847250488 scopus 로고    scopus 로고
    • Parts Advisory: Tin Whiskers
    • NASA, October, Online, Available:, 21 September
    • NASA. (October 1998), "Parts Advisory: Tin Whiskers," NA-044, [Online]. Available: http://nepp.nasa.gov/npsl/Prohibited/na-044.pdf, (21 September, 2005).
    • (1998) NA-044
  • 5
    • 14644415927 scopus 로고    scopus 로고
    • The Impact of Lead-Free Legislation Exemptions on the Electronics Industry
    • October
    • Pecht, M., Fukuda, Y. and Rajagopal, S., "The Impact of Lead-Free Legislation Exemptions on the Electronics Industry", IEEE Transactions on Electronics Packaging Manufacturing, Vol. 27, No. 4, October 2004, pp. 221-232.
    • (2004) IEEE Transactions on Electronics Packaging Manufacturing , vol.27 , Issue.4 , pp. 221-232
    • Pecht, M.1    Fukuda, Y.2    Rajagopal, S.3
  • 6
    • 33847304098 scopus 로고
    • A Discussion of SMT Solderability Issues and Relationships to Lead Finish
    • June
    • Morency, D., "A Discussion of SMT Solderability Issues and Relationships to Lead Finish", Surface Mount Technology, June 1991, pp. 30-34.
    • (1991) Surface Mount Technology , pp. 30-34
    • Morency, D.1
  • 7
    • 33847312812 scopus 로고    scopus 로고
    • IPC/JEDEC J-STD-020C, Moisture/Reflow Sensitivity Classification for Nonhermetic Solid State Surface Mount Devices, July 2004.
    • IPC/JEDEC J-STD-020C, "Moisture/Reflow Sensitivity Classification for Nonhermetic Solid State Surface Mount Devices", July 2004.
  • 8
    • 0023455318 scopus 로고
    • Finish First, SMT Soldering
    • November
    • Bowlby, R., "Finish First", SMT Soldering, Circuits Manufacturing, November 1987, pp. 76-86.
    • (1987) Circuits Manufacturing , pp. 76-86
    • Bowlby, R.1
  • 11
    • 0030168482 scopus 로고    scopus 로고
    • Tay, A., A., O. and Lin, T., Y., Moisture Diffusion and Heat Transfer in Plastic IC packages, IEEE Transaction on Components, Packaging and Manufacturing Technology- Part A, 19, No. 2, June 1996, pp. 186-193.
    • Tay, A., A., O. and Lin, T., Y., "Moisture Diffusion and Heat Transfer in Plastic IC packages", IEEE Transaction on Components, Packaging and Manufacturing Technology- Part A, Vol. 19, No. 2, June 1996, pp. 186-193.
  • 12
    • 0022313453 scopus 로고    scopus 로고
    • Thomas R., E., Stress Induced Deformation of Aluminium Metallization in Plastic Molded Semiconductor Devices, IEEE Transactions on Components, Hybrids and Manufacturing Technology, CHMT-8, No. 4, December 1985, pp. 427-433.
    • Thomas R., E., "Stress Induced Deformation of Aluminium Metallization in Plastic Molded Semiconductor Devices", IEEE Transactions on Components, Hybrids and Manufacturing Technology, Vol. CHMT-8, No. 4, December 1985, pp. 427-433.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.