NEMI recommends standard test methods to assess propensity for tin whisker growth

SMT Surface Mount Technology Magazine

Volumn 17, Issue 11, 2003, Pages

  Vo, Nhat ^a   Boguslavsky, Irina ^a   Bush, Peter ^b  

^a MOTOROLA INC   (United States)

^b UNIVERSITY AT BUFFALO   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ACCELERATED TEST METHODS; ACCELERATED TESTS; AIR-TO-AIR; ELECTRONICS; EUROPEAN; INFORMATION TECHNOLOGY INDUSTRIES; MODELING PROJECTS; NATIONAL ELECTRONICS MANUFACTURING INITIATIVES; RELATIVE HUMIDITIES; STANDARD TEST METHODS; STORAGE CONDITIONS; TEMPERATURE CYCLING; TEST METHODS; TIN WHISKERS; WHISKER FORMATIONS; WHISKER GROWTHS;

ATMOSPHERIC HUMIDITY; CRYSTAL WHISKERS; SEMICONDUCTOR GROWTH; THEOREM PROVING; TIN; TITANIUM COMPOUNDS;

TESTING;

EID: 33847266356     PISSN: 15298930     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

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