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Volumn 80, Issue 11, 1998, Pages 2433-2436

Ballistic electron emission microscopy for nonepitaxial metal/semiconductor interfaces

Author keywords

[No Author keywords available]

Indexed keywords

EIGENVALUES AND EIGENFUNCTIONS; ELECTRIC CURRENTS; ELECTRON EMISSION; ELECTRON SCATTERING; ELECTRON TUNNELING; GOLD; INTERFACES (MATERIALS); MATHEMATICAL MODELS; SEMICONDUCTING GALLIUM ARSENIDE; SEMICONDUCTING SILICON; VECTORS;

EID: 0032026663     PISSN: 00319007     EISSN: 10797114     Source Type: Journal    
DOI: 10.1103/PhysRevLett.80.2433     Document Type: Article
Times cited : (61)

References (16)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.