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Volumn 80, Issue 11, 1998, Pages 2433-2436
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Ballistic electron emission microscopy for nonepitaxial metal/semiconductor interfaces
a,c b b |
Author keywords
[No Author keywords available]
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Indexed keywords
EIGENVALUES AND EIGENFUNCTIONS;
ELECTRIC CURRENTS;
ELECTRON EMISSION;
ELECTRON SCATTERING;
ELECTRON TUNNELING;
GOLD;
INTERFACES (MATERIALS);
MATHEMATICAL MODELS;
SEMICONDUCTING GALLIUM ARSENIDE;
SEMICONDUCTING SILICON;
VECTORS;
BALLISTIC ELECTRON EMISSION MICROSCOPY;
PARALLEL WAVE VECTOR;
SCATTERING LIMIT;
ELECTRON MICROSCOPY;
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EID: 0032026663
PISSN: 00319007
EISSN: 10797114
Source Type: Journal
DOI: 10.1103/PhysRevLett.80.2433 Document Type: Article |
Times cited : (61)
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References (16)
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