Measurement of the effective focal shift in an optical trap

Optics Letters

Volumn 30, Issue 11, 2005, Pages 1318-1320

  Neuman, Keir C ^a,b   Abbondanzieri, Elio A ^a   Block, Steven M ^a  

^a STANFORD UNIVERSITY   (United States)

^b ECOLE NORMALE SUPÉRIEURE   (France)

Author keywords

[No Author keywords available]

Indexed keywords

APPROXIMATION THEORY; ELECTROMAGNETISM; LIGHT SCATTERING; MICROSCOPES; OPTICAL SYSTEMS; REFLECTION; REFRACTIVE INDEX; SCANNING;

CONFOCAL MICROSCOPES; FOCAL SHIFT; NUMERICAL APERTURE (NA); OPTICAL TRAP;

FOCUSING;

EID: 20444507097     PISSN: 01469592     EISSN: None     Source Type: Journal    
DOI: 10.1364/OL.30.001318     Document Type: Article

References (11)

1. S. H. Wiersma, P. Torok, T. D. Visser, and P. Varga, J. Opt. Soc. Am. A 14, 1482 (1997).
2. N. S. White, R. J. Errington, M. D. Flicker, and J. L. Wood, J. Microsc. 181, 99 (1996).
3. S. Hell, G. Reiner, C. Cremer, and E. H. K. Stelzer, J. Microsc. 189, 391 (1993).
4. K. C. Neuman, E. A. Abbondanzieri, R. Landick, J. Gelles, and S. M. Block, Cell 115, 437 (2003).
5. K. C. Neuman and S. M. Block, Rev. Sci. Instrum. 75, 2787 (2004).
6. K. Visscher, S. P. Gross, and S. M. Block, IEEE J. Sel. Top. Quantum Electron. 2, 1066 (1996).
7. J. A. Lock and G. Gouesbet, J. Opt. Soc. Am. A 11, 2503 (1994).
8. G. Videen, J. Opt. Soc. Am. A 8, 483 (1991).
9. F. Gittes and C. F. Schmidt, Opt. Lett. 23, 7 (1998).
10. E. Fallman and O. Axner, Appl. Opt. 42, 3915 (2003).
11. K. B. Kim, H. I. Kim, I. J. Joo, C. H. Oh, S. H. Song, P. S. Kim, and B. O. Park, Opt. Commun. 226, 25 (2003).