Automatic defect classification using boosting

Proceedings - ICMLA 2005: Fourth International Conference on Machine Learning and Applications

Volumn 2005, Issue , 2005, Pages 357-362

  Sang, Hwa Lee ^a   Hong, Il Kim ^a   Nam, Ik Cho ^a   Yu, Han Jeong ^b   Ki, Suk Chung ^b   Chung, Sam Jun ^b  

^a Seoul National University   (South Korea)

^b SAMSUNG Electronics   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

AUTOMATIC DEFECT CLASSIFICATION (ADC); BOOSTING MANNER; HAAR LIKE PATTERNS;

ALGORITHMS; CLASSIFICATION (OF INFORMATION); DEFECTS; FREQUENCY DOMAIN ANALYSIS;

SEMICONDUCTOR DEVICE MANUFACTURE;

EID: 33847278996     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ICMLA.2005.12     Document Type: Conference Paper

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