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Volumn 2005, Issue , 2005, Pages 61-66

Effect of frequency on fatigue crack growth along interface between copper film and silicon substrate

Author keywords

[No Author keywords available]

Indexed keywords

BENDING (DEFORMATION); COPPER; FATIGUE OF MATERIALS; INTERFACES (MATERIALS); SILICON; SUBSTRATES; THIN FILMS;

EID: 33847270558     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/EMAP.2005.1598236     Document Type: Conference Paper
Times cited : (2)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.