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Volumn 255, Issue 2, 2007, Pages 309-313

Study of focused ion beam response of GaSb

Author keywords

FIB; GaSb; Ion bombardment; Ion sputtering; Nanostructures; Nanowires

Indexed keywords

AUGER ELECTRON SPECTROSCOPY; ION BEAMS; ION BOMBARDMENT; NANOSTRUCTURED MATERIALS; SCANNING ELECTRON MICROSCOPY;

EID: 33847250530     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nimb.2006.11.116     Document Type: Article
Times cited : (15)

References (29)
  • 22
    • 33847251647 scopus 로고    scopus 로고
    • The Powder Diffraction File. International Centre for Diffraction Data, 12 Campus Boulevard, Newton Square, Pennsylvania 19073-3273 U.S.A.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.