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Volumn 255, Issue 2, 2007, Pages 309-313
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Study of focused ion beam response of GaSb
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Author keywords
FIB; GaSb; Ion bombardment; Ion sputtering; Nanostructures; Nanowires
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Indexed keywords
AUGER ELECTRON SPECTROSCOPY;
ION BEAMS;
ION BOMBARDMENT;
NANOSTRUCTURED MATERIALS;
SCANNING ELECTRON MICROSCOPY;
CATALYTIC VAPOR LIQUID;
CUBIC ZINC BLEND;
ION SPUTTERING;
MICROTEXTURE;
NANOWIRES;
SUBSURFACE CAVITIES;
GALLIUM COMPOUNDS;
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EID: 33847250530
PISSN: 0168583X
EISSN: None
Source Type: Journal
DOI: 10.1016/j.nimb.2006.11.116 Document Type: Article |
Times cited : (15)
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References (29)
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