|
Volumn 64, Issue 12, 2000, Pages 1141-1147
|
Anomalous defect structure formed on GaSb surface by low temperature Sn ion-implantation and its formation mechanism
|
Author keywords
[No Author keywords available]
|
Indexed keywords
CRYSTAL ORIENTATION;
ENERGY DISPERSIVE SPECTROSCOPY;
ION IMPLANTATION;
POINT DEFECTS;
SCANNING ELECTRON MICROSCOPY;
SURFACE PHENOMENA;
TRANSMISSION ELECTRON MICROSCOPY;
GALLIUM ANTIMONIDE;
SEMICONDUCTING GALLIUM COMPOUNDS;
|
EID: 0034474217
PISSN: 00214876
EISSN: None
Source Type: Journal
DOI: 10.2320/jinstmet1952.64.12_1141 Document Type: Article |
Times cited : (15)
|
References (17)
|