On Gaussian and sine wave histogram tests for wideband applications

Conference Record - IEEE Instrumentation and Measurement Technology Conference

Volumn 1, Issue , 2005, Pages 677-682

  Björsell, Niclas ^a   Händel, Peter ^b  

^a UNIVERSITY OF GÄVLE   (Sweden)

^b ROYAL INSTITUTE OF TECHNOLOGY   (Sweden)

Author keywords

ADC; Analog to Digital Converters; Histogram; Measurements; Test

Indexed keywords

LINEARITY FEATURES; SINE WAVE HISTOGRAMS; STIMULI SIGNALS;

GAUSSIAN NOISE (ELECTRONIC); INFORMATION USE; LINEARIZATION; SIGNAL DISTORTION; TABLE LOOKUP;

ANALOG TO DIGITAL CONVERSION;

EID: 33847219035     PISSN: 10915281     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/IMTC.2002.1006923     Document Type: Conference Paper

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