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Volumn , Issue , 2003, Pages

Statistical performance of Gaussian ADC histogram test

Author keywords

Cram r Rao Lower Bound; Gaussian Histogram Test; Sinewave Histogram Test

Indexed keywords

GAUSSIAN DISTRIBUTION; GRAPHIC METHODS; TESTING;

EID: 85084022272     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (20)

References (10)
  • 1
    • 0031382734 scopus 로고    scopus 로고
    • The use of linear models in A/D converter testing
    • Dec
    • P. D. Capofreddi, B. A. Wooley, “The Use of Linear Models in A/D Converter Testing,” IEEE Trans. on Circuits and Systems-I, Vol. 44, No. 12, Dec. 1997, pp. 1105-1113.
    • (1997) IEEE Trans. On Circuits and Systems-I , vol.44 , Issue.12 , pp. 1105-1113
    • Capofreddi, P.D.1    Wooley, B.A.2
  • 4
    • 0028446234 scopus 로고
    • Histogram measurement of ADC nonlinearities using sine waves
    • June
    • J. Blair, “Histogram measurement of ADC nonlinearities using sine waves,” IEEE Trans. on Instrumentation and Measurement, Vol. 43, No. 3, June 1994, pp. 373-383.
    • (1994) IEEE Trans. On Instrumentation and Measurement , vol.43 , Issue.3 , pp. 373-383
    • Blair, J.1
  • 5
    • 0036044507 scopus 로고    scopus 로고
    • Wideband communication system sensitivity to quantization noise
    • Anchorage, Alaska, USA, 21-23 May
    • A. Moschitta, D. Petri, “Wideband Communication System Sensitivity to Quantization Noise,” Proceedings of: IEEE IMTC/2002 conference, Anchorage, Alaska, USA, 21-23 May 2002, Vol. 2, pp. 1071-1075.
    • (2002) Proceedings of: IEEE IMTC/2002 Conference , vol.2 , pp. 1071-1075
    • Moschitta, A.1    Petri, D.2
  • 6
    • 0000818435 scopus 로고    scopus 로고
    • Automated ADC characterization using the histogram test stimulated by gaussian noise
    • April
    • R. C. Martins, A. C. Serra, “Automated ADC Characterization Using the Histogram Test Stimulated by Gaussian Noise,” IEEE Trans. on Instrumentation and Measurement, Vol. 48, No. 2, April 1999, pp. 471-474.
    • (1999) IEEE Trans. On Instrumentation and Measurement , vol.48 , Issue.2 , pp. 471-474
    • Martins, R.C.1    Serra, A.C.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.