Exponential Dependence of the Interlayer Exchange Coupling on the Spacer Thickness in MBE-grown Fe/SiFe/Fe Sandwiches

Physical Review Letters

Volumn 78, Issue 15, 1997, Pages 3023-3026

  de Vries, J J ^a   Kohlhepp, J ^a   den Broeder, F J A ^b   Coehoorn, R ^b   Jungblut, R ^b   Reinders, A ^b   de Jonge, W J M ^a  

^a EINDHOVEN UNIVERSITY OF TECHNOLOGY   (Netherlands)

^b PHILIPS RESEARCH LABORATORIES   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 3242892614     PISSN: 00319007     EISSN: 10797114     Source Type: Journal    
DOI: 10.1103/PhysRevLett.78.3023     Document Type: Article

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