Parallel, multi-DUT testing in an open architecture test system

Proceedings - International Test Conference

Volumn 2005, Issue , 2005, Pages 882-890

  Adachi, Toshiaki ^a   Pramanick, Ankan ^a   Elston, Mark ^a  

^a Advantest America R and D Center   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COST EFFECTIVENESS; OPEN SYSTEMS; PARALLEL PROCESSING SYSTEMS;

MULTIPLE DEVICES; OPEN ARCHITECTURE TEST SYSTEMS; PARALLEL TEST STRATEGY;

ELECTRONIC EQUIPMENT TESTING;

EID: 33847159608     PISSN: 10893539     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/TEST.2005.1584053     Document Type: Conference Paper

References (8)

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4. th. European Manufacturing Test Conference, April 2005.
5. th. European Manufacturing Test Conference, April 2005.
6. A. Pramanick et al., "Test Programming Environment in a Modular, Open Architecture Test System", Proc. 2004 IEEE International Test Conference, October 2004, pp. 413-422.
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