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Volumn , Issue , 2002, Pages 1198-
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Scan-based testing: The only practical solution for testing ASIC/Consumer products
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Author keywords
[No Author keywords available]
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Indexed keywords
AUTOMATIC TEST EQUIPMENT;
DEVICE UNDER TEST;
FUNCTIONAL TESTING;
SCAN BASED TESTING;
APPLICATION SPECIFIC INTEGRATED CIRCUITS;
AUTOMATIC TESTING;
BUILT-IN SELF TEST;
CONSUMER ELECTRONICS;
CONSUMER PRODUCTS;
DESIGN FOR TESTABILITY;
PRODUCT DEVELOPMENT;
SCANNING;
INTEGRATED CIRCUIT TESTING;
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EID: 0036446044
PISSN: 10893539
EISSN: None
Source Type: Conference Proceeding
DOI: 10.1109/TEST.2002.1041905 Document Type: Conference Paper |
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Times cited : (5)
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References (0)
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