Lowering cost of test: Parallel test or low-cost ATE?

Proceedings of the Asian Test Symposium

Volumn 2003-January, Issue , 2003, Pages 360-363

  Rivoir, J ^a  

^a AGILENT TECHNOLOGIES   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

COSTS;

CAPITAL COSTS; COST OF TESTS; LOW-COST ATE; MULTI-SITE TESTS; MULTIPLE DEVICES; PARALLEL TEST; TEST COST;

COST REDUCTION;

EID: 84954419622     PISSN: 10817735     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ATS.2003.1250837     Document Type: Conference Paper

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