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Volumn 2005, Issue , 2005, Pages 469-472

Synthesized compact model and experimental results for substrate noise coupling in lightly doped processes

Author keywords

[No Author keywords available]

Indexed keywords

DOPING (ADDITIVES); ERROR ANALYSIS; GEOMETRY; INTEGRATED CIRCUITS; SUBSTRATES;

EID: 33847132809     PISSN: 08865930     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/CICC.2005.1568708     Document Type: Conference Paper
Times cited : (2)

References (11)
  • 1
    • 17044422992 scopus 로고    scopus 로고
    • Impact of technology scaling on substrate noise generation mechanisms
    • M. Badaroglu et al., "Impact of technology scaling on substrate noise generation mechanisms," Proc. IEEE Custom Integrated Circuits Conf., 2004, pp. 501-504.
    • (2004) Proc. IEEE Custom Integrated Circuits Conf , pp. 501-504
    • Badaroglu, M.1
  • 2
    • 0032026503 scopus 로고    scopus 로고
    • Computer-aided design consideration for mixed-signal coupling in RF integrated circuits
    • Mar
    • N. K. Verghese and D. J. Allstot, "Computer-aided design consideration for mixed-signal coupling in RF integrated circuits," IEEE J. Solid-State Circuits, vol. 33, no. 3, pp. 314-323, Mar. 1998.
    • (1998) IEEE J. Solid-State Circuits , vol.33 , Issue.3 , pp. 314-323
    • Verghese, N.K.1    Allstot, D.J.2
  • 4
    • 0036051248 scopus 로고    scopus 로고
    • Combined BEM/FEM substrate resistance modeling
    • New Orleans, Louisiana, June 10-14
    • E. Schrik and N.P. van der Meijs, "Combined BEM/FEM substrate resistance modeling," Proc. Design Automation Conf., New Orleans, Louisiana, June 10-14, 2002.
    • (2002) Proc. Design Automation Conf
    • Schrik, E.1    van der Meijs, N.P.2
  • 5
    • 0036053286 scopus 로고    scopus 로고
    • A comprehensive geometry-dependent macromodel for substrate noise coupling in heavily doped CMOS processes
    • D. Ozis, T. Fiez, and K. Mayaram, "A comprehensive geometry-dependent macromodel for substrate noise coupling in heavily doped CMOS processes," Proc. IEEE Custom Integrated Circuits Conf., 2002, pp. 497-500.
    • (2002) Proc. IEEE Custom Integrated Circuits Conf , pp. 497-500
    • Ozis, D.1    Fiez, T.2    Mayaram, K.3
  • 6
    • 3042611739 scopus 로고    scopus 로고
    • Synthesized compact models of substrate noise coupling analysis and synthesis in mixed-signal ICs
    • H. Lan and R. W. Dutton, "Synthesized compact models of substrate noise coupling analysis and synthesis in mixed-signal ICs," Proc. Design, Automation and Test Conf., 2004, pp. 836-841.
    • (2004) Proc. Design, Automation and Test Conf , pp. 836-841
    • Lan, H.1    Dutton, R.W.2
  • 8
    • 5444253380 scopus 로고    scopus 로고
    • An experimental study on substrate coupling in bipolar/bicmos technologies
    • Oct
    • M. Pfost, P. Brenner, T. Huttner, and A. Romanyuk, "An experimental study on substrate coupling in bipolar/bicmos technologies," IEEE J. Solid-State Circuits, vol. 39, no. 10, pp. 1755-1763, Oct. 2004.
    • (2004) IEEE J. Solid-State Circuits , vol.39 , Issue.10 , pp. 1755-1763
    • Pfost, M.1    Brenner, P.2    Huttner, T.3    Romanyuk, A.4
  • 10
    • 33847141588 scopus 로고    scopus 로고
    • Silencer: An SCM enabled CAD tool for substrate noise analysis in mixed-signal ICs
    • Center for Integrated Systems, Stanford University
    • H. Lan, K. Mayaram, and R. W. Dutton, "Silencer: An SCM enabled CAD tool for substrate noise analysis in mixed-signal ICs," unpublished technical report, Center for Integrated Systems, Stanford University.
    • unpublished technical report
    • Lan, H.1    Mayaram, K.2    Dutton, R.W.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.