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Volumn , Issue , 2004, Pages 361-364

Analysis of substrate noise propagation in a lightly doped substrate

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; DOPING (ADDITIVES); ELECTRIC CONDUCTIVITY; MATHEMATICAL MODELS; PROBLEM SOLVING; SUBSTRATES;

EID: 17644381972     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (10)

References (12)
  • 2
    • 0027576336 scopus 로고
    • Experimental results and modeling techniques for substrate noise in mixed-signal integrated circuits
    • April
    • D.K. Su, et al., "Experimental results and modeling techniques for substrate noise in mixed-signal integrated circuits," in IEEE J. Solid-State Circuits, Vol. 28, No. 4, pp. 420-430, April 1993.
    • (1993) IEEE J. Solid-state Circuits , vol.28 , Issue.4 , pp. 420-430
    • Su, D.K.1
  • 3
    • 0031096124 scopus 로고    scopus 로고
    • Efficient modelling of substrate noise and coupling in mixed-signal SPICE designs
    • March
    • R. Singh, S. Sali, "Efficient modelling of substrate noise and coupling in mixed-signal SPICE designs," Electronics Letters, Vol. 33, no. 7, pp.:590 - 592, March 1997.
    • (1997) Electronics Letters , vol.33 , Issue.7 , pp. 590-592
    • Singh, R.1    Sali, S.2
  • 4
    • 0034228948 scopus 로고    scopus 로고
    • Analysis and experimental verification of digital substrate noise generation for EPI-type substrates
    • July
    • M. van Heijningen, et al., "Analysis and experimental verification of digital substrate noise generation for EPI-type substrates," in IEEE J. Solid-State Circuits, vol.35, no.7, pp.1002-1008, July 2000.
    • (2000) IEEE J. Solid-state Circuits , vol.35 , Issue.7 , pp. 1002-1008
    • Van Heijningen, M.1
  • 5
    • 84893798491 scopus 로고    scopus 로고
    • Modeling impact of digital substrate noise on embedded regenerative comparators
    • Sep.
    • Y. Zinzius, G.Gielen, W. Sansen, "Modeling impact of digital substrate noise on embedded regenerative comparators", Conference on European Solid-State Circuits, pp. 253-256, Sep. 2003.
    • (2003) Conference on European Solid-state Circuits , pp. 253-256
    • Zinzius, Y.1    Gielen, G.2    Sansen, W.3
  • 8
    • 0001431369 scopus 로고    scopus 로고
    • Modeling and measurement of substrate coupling in Si-bipolar IC's up to 40 GHz
    • April
    • M. Pfost, and H.-M. Rein, "Modeling and Measurement of Substrate Coupling in Si-Bipolar IC's up to 40 GHz," in IEEE J. of Solid-State Circuit (JSSC), Vol. 33, no. 4, pp. 582-591, April 1998.
    • (1998) IEEE J. of Solid-state Circuit (JSSC) , vol.33 , Issue.4 , pp. 582-591
    • Pfost, M.1    Rein, H.-M.2
  • 9
    • 84871171632 scopus 로고    scopus 로고
    • SubstrateStorm: http://www.cadence.com/products/substrate_noise_analysis. html
    • SubstrateStorm
  • 10
    • 0019565721 scopus 로고
    • An efficient integration technique for use in the multilayer analysis of spreading resistance profiles
    • May
    • H. L. Berkowitz, and R. A Lux, "An Efficient Integration Technique for Use in the Multilayer Analysis of Spreading Resistance Profiles," J. Electroch. Soc., Vol. 128, no. 5, May 1981.
    • (1981) J. Electroch. Soc. , vol.128 , Issue.5
    • Berkowitz, H.L.1    Lux, R.A.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.