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Volumn 2, Issue , 2005, Pages 898-901
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Thickness shear mode vibrations in silicon bar resonators
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Author keywords
[No Author keywords available]
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Indexed keywords
ACOUSTIC TRANSDUCERS;
DIELECTRIC DEVICES;
ELECTROSTATICS;
NATURAL FREQUENCIES;
RESONATORS;
SILICON ON INSULATOR TECHNOLOGY;
SILICON WAFERS;
QUALITY FACTOR (Q);
QUARTER-WAVE THICKNESS;
SILICON BAR RESONATOR;
SILICON SUBSTRATE;
VIBRATIONS (MECHANICAL);
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EID: 33847128343
PISSN: 10510117
EISSN: None
Source Type: Conference Proceeding
DOI: 10.1109/ULTSYM.2005.1602995 Document Type: Conference Paper |
Times cited : (6)
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References (6)
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