On the structure and composition of nanoscale TiAlN/VN multilayers

Philosophical Magazine

Volumn 87, Issue 6, 2007, Pages 967-978

  Zhou, Z ^a   Rainforth, W M ^a   Falke, U ^b   Falke, M ^b   Bleloch, A ^b   Hovsepian, P E ^c  

^a UNIVERSITY OF SHEFFIELD   (United Kingdom)

^b DARESBURY LABORATORY   (United Kingdom)

^c SHEFFIELD HALLAM UNIVERSITY   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

ABERRATIONS; COMPUTER SIMULATION; CRYSTAL GROWTH; INTERFACES (MATERIALS); LAYERED MANUFACTURING; NANOSTRUCTURED MATERIALS; TITANIUM COMPOUNDS;

LAYER THICKNESS; NUMERICAL MODELLING; PHYSICAL STRUCTURE; SPHERICAL ABERRATION;

MULTILAYERS;

EID: 33847125287     PISSN: 14786435     EISSN: 14786443     Source Type: Journal    
DOI: 10.1080/14786430601019433     Document Type: Article

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