SCOPUS 정보 검색 플랫폼

Surface and Coatings Technology

Volumn 183, Issue 2-3, 2004, Pages 275-282

Elemental distributions and substrate rotation in industrial TiAlN/VN superlattice hard PVD coatings

(6) Zhou, Z a Rainforth, W M a Rother, B b Ehiasarian, A P c Hovsepian, P Eh c Munz W D c

a UNIVERSITY OF SHEFFIELD (United Kingdom)

b DMS GmbH (Germany)

c SHEFFIELD HALLAM UNIVERSITY (United Kingdom)

Author keywords

Energy filtered TEM; Numerical prediction; Substrate rotation; TiAlN VN multilayers

Indexed keywords

COATING TECHNIQUES; ELECTRON SPECTROSCOPY; PHYSICAL VAPOR DEPOSITION; SCANNING ELECTRON MICROSCOPY; SUBSTRATES; SUPERLATTICES; TRANSMISSION ELECTRON MICROSCOPY;

ELECTRON SPECTROSCOPIC IMAGES (ESI); FIELD EMISSION GUN TRANSMISSION ELECTRON MICROSCOPE;

TITANIUM ALLOYS;

COATING;

EID: 2442547442 PISSN: 02578972 EISSN: None Source Type: Journal
DOI: 10.1016/j.surfcoat.2003.09.060 Document Type: Article

Times cited : (42)

References (22)

1
- 21544437674
- Helmersson U. Todorova S. Barnett S.A. Sundgren J.-E. Markert L.C. Greene J.E. J. Appl. Phys. 62 1987 481
- (1987) J. Appl. Phys. , vol.62 , pp. 481
- Helmersson, U.¹ Todorova, S.² Barnett, S.A.³ Sundgren, J.-E.⁴ Markert, L.C.⁵ Greene, J.E.⁶

2
- 0033369237
- Lewis D.B. Wadsworth I.P. Münz W.-D. Kuzel R. Jr. Valvoda V. Surf. Coat. Technol. 116-119 1999 284
- (1999) Surf. Coat. Technol. , vol.116-119 , pp. 284
- Lewis, D.B.¹ Wadsworth, I.P.² Münz, W.-D.³ Kuzel Jr., R.⁴ Valvoda, V.⁵

3
- 0004230243
- January
- Barnett S.A. Madan A. Phys. World January 1998 45
- (1998) Phys. World , pp. 45
- Barnett, S.A.¹ Madan, A.²

4
- 0035060710
- Münz W.-D. Lewis D.B. Hovsepian P.Eh. Schönjahn C. Ehiasarian A. Smith I.J. Surf. Eng. 17 2001 15
- (2001) Surf. Eng. , vol.17 , pp. 15
- Münz, W.-D.¹ Lewis, D.B.² Hovsepian, P.Eh.³ Schönjahn, C.⁴ Ehiasarian, A.⁵ Smith, I.J.⁶

5
- 0027839332
- Rother B. Jehn H.A. Surf. Coat. Technol. 62 1993 635
- (1993) Surf. Coat. Technol. , vol.62 , pp. 635
- Rother, B.¹ Jehn, H.A.²

6
- 0028447726
- Rother B. Surf. Coat. Technol. 64 1994 155
- (1994) Surf. Coat. Technol. , vol.64 , pp. 155
- Rother, B.¹

7
- 0030384074
- Rother B. Jehn H.A. Gabriel H.M. Surf. Coat. Technol. 86-87 1993 207
- (1993) Surf. Coat. Technol. , vol.86-87 , pp. 207
- Rother, B.¹ Jehn, H.A.² Gabriel, H.M.³

8
- 0033387792
- Rother B. Ebersbach G. Gabriel H.M. Surf. Coat. Technol. 116-119 1999 694
- (1999) Surf. Coat. Technol. , vol.116-119 , pp. 694
- Rother, B.¹ Ebersbach, G.² Gabriel, H.M.³

9
- 0030396810
- Cawley J. Titchmarsh J.M. Donohue L.A. Surf. Coat. Technol. 86-87 1996 357
- (1996) Surf. Coat. Technol. , vol.86-87 , pp. 357
- Cawley, J.¹ Titchmarsh, J.M.² Donohue, L.A.³

10
- 0036495858
- Meidia H. Cullis A.G. Schönjahn C. Münz W.-D. Rodenburg J.M. Surf. Coat. Technol. 151-152 2002 209
- (2002) Surf. Coat. Technol. , vol.151-152 , pp. 209
- Meidia, H.¹ Cullis, A.G.² Schönjahn, C.³ Münz, W.-D.⁴ Rodenburg, J.M.⁵

11
- 0027113329
- Münz W.-D. Schulze D. Hauzer F.J.M. Surf. Coat. Technol. 50 1992 169
- (1992) Surf. Coat. Technol. , vol.50 , pp. 169
- Münz, W.-D.¹ Schulze, D.² Hauzer, F.J.M.³

12
- 0029125937
- Hofer F. Warbichler P. Grogger W. Ultramicroscopy 59 1995 15
- (1995) Ultramicroscopy , vol.59 , pp. 15
- Hofer, F.¹ Warbichler, P.² Grogger, W.³

13
- 0032007473
- Warbichler P. Hofer F. Hofer P. Letofsky E. Micron 29 1998 63
- (1998) Micron , vol.29 , pp. 63
- Warbichler, P.¹ Hofer, F.² Hofer, P.³ Letofsky, E.⁴

14
- 0030472369
- Hofer F. Warbichler P. Buchmayr B. Kleber S. J. Microscopy 184 1996 163
- (1996) J. Microscopy , vol.184 , pp. 163
- Hofer, F.¹ Warbichler, P.² Buchmayr, B.³ Kleber, S.⁴

15
- 0029056771
- Crozier P.A. Ultramicroscopy 58 1995 157
- (1995) Ultramicroscopy , vol.58 , pp. 157
- Crozier, P.A.¹

16
- 0033079349
- Walther T. Humphreys C.J. J. Cryst. Growth 197 1999 113
- (1999) J. Cryst. Growth , vol.197 , pp. 113
- Walther, T.¹ Humphreys, C.J.²

17
- 0034023809
- Dunin-Borkowski R.E. Ultramicroscopy 83 2000 193
- (2000) Ultramicroscopy , vol.83 , pp. 193
- Dunin-Borkowski, R.E.¹

18
- 0003400638
- New York, Chichester: Wiley
- Chapman B. Glow Discharge Processes: Sputtering and Plasma Etching 1980 233 Wiley New York, Chichester
- (1980) Glow Discharge Processes: Sputtering and Plasma Etching , pp. 233
- Chapman, B.¹

19
- 0003394101
- second ed., Plenum Press, New York
- R.F. Egerton, Electron Energy-loss Spectroscopy in the Electron Microscope, second ed., Plenum Press, New York, 1996, pp. 347-352
- (1996) Electron Energy-loss Spectroscopy in the Electron Microscope , pp. 347-352
- Egerton, R.F.¹

20
- 0029619346
- Krivanek O.L. Kundmann M.K. Kimoto K. J. Microscopy 180 1995 277
- (1995) J. Microscopy , vol.180 , pp. 277
- Krivanek, O.L.¹ Kundmann, M.K.² Kimoto, K.³

21
- 0037169850
- Rainforth W.M. Black M.P. Higginson R.L., et-al. Acta Mater. 50 2002 735
- (2002) Acta Mater. , vol.50 , pp. 735
- Rainforth, W.M.¹ Black, M.P.² Higginson, R.L.³

22
- 0033042878
- Freitag B. Mader W. J. Microscopy 194 1999 42
- (1999) J. Microscopy , vol.194 , pp. 42
- Freitag, B.¹ Mader, W.²

* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.