Rectification behaviour of molecular layers on Si(111)

Solid State Communications

Volumn 141, Issue 12, 2007, Pages 645-648

  Hallbäck, Ann Sofie ^a   Poelsema, Bene ^a   Zandvliet, Harold J W ^a  

^a UNIVERSITY OF TWENTE   (Netherlands)

Author keywords

A. Semiconductors; A. Surfaces and interfaces; A. Thin films; C. Scanning tunnelling microscopy

Indexed keywords

ADSORPTION; DIODES; ELECTRONIC STRUCTURE; INTERFACES (MATERIALS); SCANNING TUNNELING MICROSCOPY; SEMICONDUCTING FILMS; THIN FILMS;

DIODE LIKE BEHAVIOR; ELECTRON DISTRIBUTION; MOLECULAR LAYERS; RECTIFICATION;

SEMICONDUCTING SILICON;

EID: 33847102783     PISSN: 00381098     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ssc.2007.01.015     Document Type: Article

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