Room temperature generation of terahertz radiation from a grating-bicoupled plasmon-resonant emitter: Size effect

Applied Physics Letters

Volumn 90, Issue 6, 2007, Pages

  Meziani, Yahya Moubarak ^a   Otsuji, Taiichi ^a   Hanabe, Mitsuhiro ^a   Ishibashi, Takuma ^a   Uno, Tomohiro ^a   Sano, Eiichi ^b  

^a TOHOKU UNIVERSITY   (Japan)

^b HOKKAIDO UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRON MOBILITY; LIGHT EMISSION; PLASMA WAVES; RADIATION EFFECTS;

PLASMON RESONANT EMITTER; TERAHERTZ RADIATION;

DIFFRACTION GRATINGS;

EID: 33846969139     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2459879     Document Type: Article

References (21)

1. M. Dyakonov and M. Shur, Phys. Rev. Lett. 71, 2465 (1993).
2. W. Knap, Y. Deng, S. Rumyantsev, J.-Q. Lu, M. S. Shur, C. A. Saylor, and L. C. Brunel, Appl. Phys. Lett. 80, 3433 (2002).
3. W. Knap, F. Teppe, Y. M. Meziani, N. Dyakonova, J. Lusakowski, F. Boeuf, T. Skotnicki, Hirakawa, D. Maude, S. Rumyantsev, and M. S. Shur, Appl. Phys. Lett. 85, 675 (2004).
4. S. J. Allen, Jr., D. C. Tsui, and R. A. Logan, Phys. Rev. Lett. 38, 980 (1977).
5. T. Otsuji, M. Hanabe, and O. Ogawara, Appl. Phys. Lett. 85, 2119 (2004).
6. Y. Deng, R. Kersting, J. Xu, R. Ascazubi, X.-C. Zhang, M. S. Shur, R. Gaska, G. S. Simin, M. Asif Khan, and V. Ryzhii, Appl. Phys. Lett. 84, 70 (2004).
7. Y. M. Meziani, J. Lusakowski, N. Dyakonova, W. Knap, D. Seliuta, E. Sirmulis, J. Devenson, G. Valusis, F. Boeuf, and T. Skotnicki, IEICE Trans. Electron. E89-C, 993 (2006).
8. N. Sekine, K. Yamanata, K. Hirakawa, M. Voseburger, P. Haring-Bolivar, and H. Kurz, Appl. Phys. Lett. 74, 1006 (1999).
9. A. Satou, V. Ryzhii, I. Khmyrova, M. Ryzhii, and M. S. Shur, J. Appl. Phys. 95, 2084 (2004).
10. T. Otsuji, S. Nakae, and H. Kitamura, IEICE Trans. Electron. E84-C, 1470 (2001).
11. V. Ryzhii, I. Kymyrova, A. Sato, P. O. Vaccaro, T. Aida, and M. Shur, J. Appl. Phys. 92, 5756 (2002).
12. T. Otsuji, M. Hananbe, T. Nishimura, and E. Sano, Opt. Express 14, 4815 (2006).
13. X. G. Peralta, S. J. Allen, M. C. Wanke, N. E. Harff, J. A. Simmons, M. P. Lilly, J. L. Reno, P. J. Burke, and J. P. Eisenstein, Appl. Phys. Lett. 81, 1627 (2002).
14. M. Lee, M. Wanke, and J. Reno, Appl. Phys. Lett. 86, 033501 (2005).
15. R. J. Wilkinson, C. D. Ager, T. Duffield, H. P. Hughes, D. G. Hasko, H. Ahmed, J. E. F. Frost, D. C. Peacock, D. A. Ritchie, G. A. C. Jones, C. R. Whitehouse, and N. Apsley, J. Appl. Phys. 71, 6049 (1992).
16. V. Ryzhii, I. Khmyrova, and M. Shur, J. Appl. Phys. 91, 1875 (2002).
17. K. Hirakawa, K. Yamanaka, M. Grayson, and D. C. Tsui, Appl. Phys. Lett. 67, 2326 (1995).
18. S. A. Mikhailov, Phys. Rev. B 58, 1517 (1998).
19. D. C. Tsui, E. Gornik, and R. A. Logan, Solid State Commun. 35, 875 (1980).
20. M. Dyakonov and M. S. Shur, IEEE Trans. Electron Devices 43, 380 (1996).
21. T. Otsuji, Y. M. Meziani, M. Hanabe, T. Ishibashi, T. Uno, and E. Sano, Appl. Phys. Lett. 89, 263502 (2006).