Comparison of FDM, FEM and BEM for electrostatic charged particle optics

Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

Volumn 427, Issue 1-2, 1999, Pages 357-362

  Cubric, D ^a   Lencova, B ^b   Read, F H ^a   Zlamal, J ^b  

^a UNIVERSITY OF MANCHESTER   (United Kingdom)

^b INSTITUTE OF SCIENTIFIC INSTRUMENTS   (Czech Republic)

Author keywords

[No Author keywords available]

Indexed keywords

BOUNDARY ELEMENT METHOD; CHARGED PARTICLES; COMPUTER SOFTWARE; ELECTROSTATICS; FINITE DIFFERENCE METHOD; FINITE ELEMENT METHOD; PROBLEM SOLVING;

ELECTROSTATIC CHARGED PARTICLE OPTICS;

PARTICLE OPTICS;

EID: 0345533959     PISSN: 01689002     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0168-9002(98)01563-0     Document Type: Article

References (7)

1. D. Cubric, B. Lencova, F.H. Read, Electron microscopy and analysis 1997, Institute of Physics Conference Series vol. 153, 1997, pp. 91-94.
2. SIMION Program, information available at http://www.srv.net/~klack/simion.html.
3. SIM3D Program, information available at http://fyzika.fme.vutbr.cz/~zlamal.
4. ELENS Program, information available at http://www.isibrno.cz/~bohunka.
5. CPO Programs, programs and information available at http://cpo.ph.man.ac.uk/.
6. Hawkes P.H., Kasper E. Principles of Electron Optics. 1989;Academic Press, New York.
7. Read F.H. J. Comput. Phys. 133:1997;1.